Last edited by Kagami
Monday, July 27, 2020 | History

3 edition of IEEE trial-use standard for test equipment description language (TEDL) found in the catalog.

IEEE trial-use standard for test equipment description language (TEDL)

IEEE trial-use standard for test equipment description language (TEDL)

  • 350 Want to read
  • 22 Currently reading

Published by Institute of Electrical and Electronics Engineers in New York, NY .
Written in English

    Subjects:
  • ATLAS (Computer program language) -- Standards,
  • Automatic test equipment,
  • Electronic apparatus and appliances -- Testing -- Data processing

  • Edition Notes

    Statementsponsor, IEEE SCC20 Test Equipment Description Subcommittee of the IEEE Standards Board.
    SeriesIEEE std -- 993-1990.
    ContributionsIEEE Standards Board. IEEE SCC20 Test Equipment Description Subcommittee.
    The Physical Object
    Pagination1 v. (various pagings) :
    ID Numbers
    Open LibraryOL20525988M
    ISBN 101559370297
    LC Control Number90055419
    OCLC/WorldCa22338549

    IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions ISO (R) INDUSTRIAL AUTOMATION SYSTEMS AND INTEGRATION - PRODUCT DATA REPRESENTATION AND EXCHANGE - PART DESCRIPTION METHODS: THE EXPRESS LANGUAGE . IEEE IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions.

    ieee standard for test equipment description language (tedl) ieee electrothermic power meters, standard for: ieee performance measurements of a/d and d/a converters for pmc televisions video circuits: bs iso/iec/ieee ae: This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATML Instrument Description component defined in IEEE Std ,"IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML:Exchanging Instrument Descriptions.".

    To fully capitalize on embedded instrumentation, several other standards besides the IEEE P IJTAG standard often work together. These would include the IEEE Boundary-Scan Standard and its enhanced version, the IEEE Enhanced Boundary-Scan Standard, as well as the IEEE Core Test Standard. ieee trial use standard for common ada packages for a broad-based environment for test (abbet) ieee automatic test markup language (atml) for exchanging automatic test equipment and test information via xml: ieee draft d3 guide for the use of ieee std , standard for signal and test definition.


Share this book
You might also like
The Hawthorne heritage

The Hawthorne heritage

Exploring printmaking for young people

Exploring printmaking for young people

Notes on Virginias childhood

Notes on Virginias childhood

I will convert sinners

I will convert sinners

The preparation of manuscripts for the printer

The preparation of manuscripts for the printer

The Law of Population (Works on Malthus and the Population Controversy, 1803ã1830)

The Law of Population (Works on Malthus and the Population Controversy, 1803ã1830)

Mortal strife

Mortal strife

The protection of persons against ionising radiation arising from any work activity

The protection of persons against ionising radiation arising from any work activity

Recreation in America

Recreation in America

gospels

gospels

Resistance against colonialism

Resistance against colonialism

Long Distance (Review Israeli Writers Chapbook Ser. : No. 2)

Long Distance (Review Israeli Writers Chapbook Ser. : No. 2)

Language and word processing applications

Language and word processing applications

IEEE trial-use standard for test equipment description language (TEDL) Download PDF EPUB FB2

Withdrawn Standard. IEEE trial-use standard for test equipment description language book Date: No longer endorsed by the IEEE. A language useful for describing Automatic Test Equipment (ATE) instrumentation and configurations, as well as Interface Test Adapters (ITA), is defined.

Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS environments. Get this from a library. IEEE trial-use standard for test equipment description language (TEDL).

[IEEE Standards Board. IEEE SCC20 Test Equipment Description Subcommittee.;]. IEEE StdIEEE Trial-Use Standard for Test Equipment Description Language (TEDL), defines a language useful for describing automatic test equipment (ATE) instrumentation and configurations, as well as interface test adapters (ITA).

Principally intended for testing environments using the ATLAS test language, TEDL can also be used to describe instrumentation in non-ATLAS. This trial-use standard specifies an exchange format, using eXtensible Markup Language (XML), for identifying instrumentation that may be integrated in an automatic test system (ATS) that is to be used to test and diagnose a unit under test (UUT).

standard for higher performance protocol for the standard digital interface for programmable instrumentation: ieee trial use standard for a broad-based environment for test (abbet) overview and architecture: tia f(r) interface between data terminal equipment and data circuit-terminating equipment employing serial.

Scope: The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT.

This is in support of the development of test program sets (TPSs. This document specifies an exchange format, using the extensible markup language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a unit under test (UUT).

This is in support of the development of test program sets (TPSs) that will be used in an. Content Description New IEEE Standard - Active. This document specifies an exchange format, using the extensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a Unit Under Test (UUT).

IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions IEEE StdGet this from a library. IEEE trial-use standard for Automatic Test Markup Language (ATML) for exchanging automatic test equipment and test information via XML: exchanging instrument descriptions.

[Institute of Electrical and Electronics Engineers.;] -- This trial-use standard specifies the framework for the family of ATML standards.

ATML defines a standard exchange medium for sharing. IEEE - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions. This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATMLTest Configuration component defined in IEEE Std ,"IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML:Exchanging Test Configuration Descriptions.".

IEEE Draft Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML: Exchanging Instrument Descriptions Abstract: This document specifies an exchange format, using XML, for identifying instrumentation which may be integrated in an automatic test system (ATS) that is to be.

Get this from a library. IEEE trial-use standard for Automatic Test Markup Language (ATML) for exchanging automatic test equipment and test information via XML: exchanging instrument descriptions. [Institute of Electrical and Electronics Engineers.;] -- Abstract: This trial-use standard specifies an exchange format, using eXtensible Markup Language (XML), for identifying.

IEEE Std (Trial Use): IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML.

Publisher: [Place of publication not identified] IEEE, IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions.

The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining.

Get this from a library. IEEE trial-use standard for Automatic Test Markup Language (ATML) for exchanging automatic test equipment and test information via XML: exchanging test descriptions.

[Institute of Electrical and Electronics Engineers.; IEEE-SA Standards Board.;] -- Abstract: This document specifies an exchange format, using the eXtensible Markup Language (XML), for exchanging the test.

IEEE Xplore. Delivering full text access to the world's highest quality technical literature in engineering and technology. C - IEEE Trial-Use Standard for Dielectric Test Requirements for Power Transformers for Operation at System Voltages from kV Through kV - IEEE Standard. IEEE a - IEEE Guide for the Use of IEEE Std (TM), IEEE Standard for Signal and Test Definition Amendment 1: Addition of Guidelines for Producing Reusable Test Signal Frameworks for Use on Platforms Utilizing Automatic Test Markup Language.

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced.

Use of electronic test equipment is essential to any serious work on electronics systems. This schema is a World Wide Web Consortium (W3C) Extensible Markup Language (XML) binding of the ATML Instrument Instance component defined in IEEE Std ,"IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML:Exchanging Instrument Descriptions.".IEEE STANDARD FOR ARTIFICIAL INTELLIGENCE EXCHANGE AND SERVICE TIE TO ALL TEST ENVIRONMENTS (AI-ESTATE): SERVICE SPECIFICATION: IEEE IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions: IEC IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions.

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the static description of an Instrument.